The table below presents quarterly operational metrics for 10 semiconductor fabrication plants:
| Plant ID | Region | Wafer Size | Defect Density (defects/cm²) | Operational Yield (%) |
|---|---|---|---|---|
| Fab 101 | Asia-Pacific | 300 mm | 1.8 | 94.2 |
| Fab 102 | Asia-Pacific | 300 mm | 2.4 | 92.6 |
| Fab 103 | Asia-Pacific | 300 mm | 3.1 | 89.5 |
| Fab 104 | Asia-Pacific | 300 mm | 3.7 | 88.0 |
| Fab 105 | Asia-Pacific | 300 mm | 4.3 | 86.4 |
| Fab 106 | Asia-Pacific | 300 mm | 5.1 | 83.1 |
| Fab 107 | North America | 300 mm | 2.2 | 93.0 |
| Fab 108 | North America | 200 mm | 4.8 | 85.0 |
| Fab 109 | Europe | 300 mm | 3.5 | 87.5 |
| Fab 110 | Europe | 200 mm | 5.5 | 81.0 |
Statement: For semiconductor fabrication plants with a wafer size located in the Asia-Pacific region, the median defect density is greater than .
Cevap: Cevap
Cevap
True
The correct response is True because the filtered subset of 6 plants in the Asia-Pacific region with 300 mm wafer sizes has defect densities of 1.8, 2.4, 3.1, 3.7, 4.3, and 5.1 defects/cm². Averaging the two middle values (3.1 and 3.7) yields a median of 3.4 defects/cm², which exceeds 3.3 defects/cm².
Adım Adım Çözüm
Anahtar Kavram
Descriptive Statistics Interpretation (Median of Even-Count Subsets)