A semiconductor manufacturing plant replaced its human quality-control inspectors with an advanced automated optical inspection (AOI) system to screen microchips for microscopic structural defects. Prior laboratory testing conclusively established that the AOI system successfully identifies 99% of structurally defective chips, whereas human inspectors historically identified only 85%. Since the factory installed the AOI system on its assembly lines, the inherent defect rate of the manufacturing process has remained identical, and the total number of raw microchips manufactured prior to inspection has not changed. Nevertheless, the total number of structurally defective microchips that pass inspection and are shipped to consumers each month has inexplicably doubled.
Statement: The proposition that the AOI system is overly sensitive and frequently flags perfectly functional microchips as defective, leading to a massive increase in the number of functional chips that are discarded before shipping, successfully resolves the apparent discrepancy described above.
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